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01:19:53
The Origins of Silicon Valley: Characteristics of a Startup Environment
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Showing 89 - 110 of 289
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Reliability Problems of Optoactive Materials in LED Packaging
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Electromigration Failure Caused by Interdiffusion between Al Trace and Cu Seed Layer in the Microbump in 3D IC
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Electronic-Photonic Heterogeneous Integration for Co-Packaged Optics for High Performance Computing
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Overview of Advanced System Integration and Packaging (ASIP) at Purdue University
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HALT and TC Reliability of QFN Assemblies with and without Urethane Coating
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GDS Factory: Build Better Hardware with Better Software
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Experiences of Electronics Packaging at Scania: Challenges and Opportunities
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